09.23.16
Sept. 23, 206
www.appliedmaterials.com
Applied Materials, Inc. introduced the display industry’s first high-resolution inline e-beam review (EBR) system, increasing the speed at which manufacturers of OLED and UHD LCD screens can achieve optimum yields and bring new display concepts to market.
Applied is the semiconductor industry leader in EBR with more than 70% market share in 2015. The company has combined its leading-edge SEM (scanning electron microscope) capabilities used in semiconductor device review with a large-scale display vacuum platform, resulting in an inline EBR technology that is the fastest, most effective method to discover and address the root causes of killer defects in advanced mobile and TV displays.
Applied’s EBR system has received orders from 6 of the top 10 largest display manufacturers in the world and demand is increasing as manufacturers look to quickly and cost effectively optimize their yields and bring new types of displays to market faster.
“Applied’s unique ability to combine semiconductor yield techniques and panel-level SEM technology expands our addressable market and avoids costly yield excursions for our customers,” said Ali Salehpour, SVP and GM, Display and Adjacent Markets and Applied Global Services, Applied Materials. “Emerging applications such as augmented and virtual reality and smart vehicles require better displays with new form factors. These applications are driving demand for solutions like our EBR tool that give customers significant time-to-market advantages.”
Prior to the introduction of Applied’s EBR system, conducting SEM analysis on displays required breaking the glass substrate into pieces and examining each piece separately under a microscope. This is not only costly and time consuming but also makes it nearly impossible to determine the location of the defect on the full panel. Applied solves these limitations by providing inline SEM review at the industry’s highest resolution and throughput without requiring the panel to be broken.
www.appliedmaterials.com
Applied Materials, Inc. introduced the display industry’s first high-resolution inline e-beam review (EBR) system, increasing the speed at which manufacturers of OLED and UHD LCD screens can achieve optimum yields and bring new display concepts to market.
Applied is the semiconductor industry leader in EBR with more than 70% market share in 2015. The company has combined its leading-edge SEM (scanning electron microscope) capabilities used in semiconductor device review with a large-scale display vacuum platform, resulting in an inline EBR technology that is the fastest, most effective method to discover and address the root causes of killer defects in advanced mobile and TV displays.
Applied’s EBR system has received orders from 6 of the top 10 largest display manufacturers in the world and demand is increasing as manufacturers look to quickly and cost effectively optimize their yields and bring new types of displays to market faster.
“Applied’s unique ability to combine semiconductor yield techniques and panel-level SEM technology expands our addressable market and avoids costly yield excursions for our customers,” said Ali Salehpour, SVP and GM, Display and Adjacent Markets and Applied Global Services, Applied Materials. “Emerging applications such as augmented and virtual reality and smart vehicles require better displays with new form factors. These applications are driving demand for solutions like our EBR tool that give customers significant time-to-market advantages.”
Prior to the introduction of Applied’s EBR system, conducting SEM analysis on displays required breaking the glass substrate into pieces and examining each piece separately under a microscope. This is not only costly and time consuming but also makes it nearly impossible to determine the location of the defect on the full panel. Applied solves these limitations by providing inline SEM review at the industry’s highest resolution and throughput without requiring the panel to be broken.
